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As Grown Quartz

Pure Z Quartz For Mechanical Processing


Typical specifications for as grown single crystal cultured quartz material grown on a Z plate seed. These crystals are suitable for lumbering into multiple bars for AT-cut blanks or for lumbering into single pure-Z bars for further fabrication using mechanical wafer processing techniques.	Section Drawing

Mechanical Characteristics

Description	Unit	Typical Value	Tolerance
Z_eff	mm	22 or 38	±4
Distribution of Z_eff		Customer specified
X	mm	X_seed +15	±2
Y	mm	165,175,or 200	±3
Centricity of seed [Z₁ - Z₂]	mm	1.0	maximum
Z taper in useful volume [Z_max - Z_min]	mm	1.5	maximum
A	mm	>X_seed
Cracks in useful volume	count	none
Condition of -X-surface	qualitative	smooth

Material Characteristics

Description		Unit	Typical Value		Tolerance
Handedness			Right
Twins in useful volume		Count	None
Infrared a (3500cm-1)	α - units		Grade B: 0.045		maximum
			Grade C: 0.060		maximum
			Grade II	Grade I
Inclusions (diameter)	25-75 µm	cm³	5	4	maximum
	4 75-100 µm	cm³	4	2	maximum
	>lOO µm	cm³	3	2	maximum
Etch channels		cm²	Grade 4: 300		maximum
Filaments		qualitative	150		maximum

Seed Characteristic

Description	Unit	Typical Value	Tolerance
X_seed	mm	39.0, 54.0, or 65.0	-0.0 +0.5
Z	mm	2.0	-0.5 +0.2
Orientation of Z-surfaces @ X-axis	arc minutes	0	±15
Orientation of Z-surfaces @ Y-axis	arc minutes	0	±30
Orientation of X-surfaces @ Z-axis	arc minutes	0	±15
End chamfer [X_seed - X_seed min]	mm	2.0	maximum

Marking Requirements

Location	-X surface
Information	Batch, supplier identification, and orientation (Z-surfaces around X-axis)
Method	Ink Stamp

Packaging Requirements

Bars are classified into 1 mm groups based on Zeff Each carton contains only bars within one size group.
Bars are packed in individual cells within double wall cardboard boxes containing approximately 25 kg.
The size group and batches contained are marked on the exterior of the carton.
Cartons are appropriately marked for export purposes and firmly affixed to wooden pallets suitable for sea shipment.

References

International Electrotechnical Commission Standard, CEI/IEC 758, Second edition, 1993-04.

Institute of Electrical and Electronic Engineers Standard on Piezoelectricity ANSI / IEEE Std 176-1 987.

_{Reproduced
by kind permission of
Sawyer Research Products,
Inc.© Sawyer Research Products,
Inc. Specifications
subject to change without
notice.All
rights reserved} _{Roditi International 2007}