Quartz Crystal Test & Production
Measurement Equipment
| Product | Part No. | Datasheet |
|---|---|---|
| 250B-1 Network Analyzer | 6300352 | ![]() |
| 250C 500MHz Network Analyzer | 6300343 | ![]() |
| 250D 800MHz Network Analyzer | 6300404 | ![]() |
| Crystal Test Fixtures (for high drive application) | 6300394 | ![]() |
| Crystal Test Fixtures (for leaded, SMD, and crystal blank applications) | 6300331 | ![]() |
| Low Frequency/Watch Crystal Measurement Test Fixture | 6300332 | ![]() |
| Crystal Measurement Reference Crystal | 6300338 | ![]() |
Automatic Test Systems
| Product | Part No. | Datasheet |
|---|---|---|
| W-350D Quartz Crystal Test and Sort System | 6300345 | ![]() |
| W-940A Blank Sorter | 6300392 | ![]() |
| W-910A SMD Crystal Pallet Test System | 6300367 | ![]() |
Temperature Test Systems
Base Electrode Plating
| Product | Part No. | Datasheet |
|---|---|---|
| W-5600 Base Plating System | 6300137 | ![]() |
| 5600 Capacitively Coupled Plasma Option | 6300342 | ![]() |
Final Frequency Adjustment
| Product | Part No. | Datasheet |
|---|---|---|
| Dual W-5910iE Quartz Crystal Etching System | 6300405 | ![]() |
| Dual W-5910iB Quartz Crystal Etching System | 6300402 | ![]() |
| W-5910ie Quartz Crystal Etching System | 6300396 | ![]() |
| W-5910iB Quartz Crystal Etching System | 6300395 | ![]() |
| W-5910i Quartz Crystal Inline Etching System | 6300380 | ![]() |
| W-5910 Quartz Crystal Etching System | 6300354 | ![]() |
| W-5710A Leaded/SMD Crystal Plating System | 6300403 | ![]() |
| W-5250S Plating System | 6300344 | ![]() |
| W-250B/12SA Crystal Plating System | 6300351 | ![]() |
| W-900A W-12SA SMD Plating Disc Unloader/Loader | 6300364 | ![]() |
| W-250B/6SA Crystal Plating System Upgrade | 6300239 | ![]() |
| 250B/6SA Dual Plating System Upgrade | 6300358 | ![]() |
Oscillator Test & Production
Measurement Equipment
| Product | Part No. | Datasheet |
|---|---|---|
| W-280B Oscillator Analyzer | 6300376 | ![]() |
| W-280B TCXO Programming Benchtop System | 6300400 | ![]() |
Automatic Test Systems
| Product | Part No. | Datasheet |
|---|---|---|
| W-920A SMD Oscillator Pallet Test System | 6300368 | ![]() |
| Surface Mount Device Pallet Arrays | 6300136 | ![]() |
Temperature Test Systems
Final Frequency Adjustment
| Product | Part No. | Datasheet |
|---|---|---|
| Dual W-5910iE Quartz Crystal Etching System | 6300405 | ![]() |
| Dual W-5910iB Quartz Crystal Etching System | 6300402 | ![]() |
| W-5910ie Quartz Crystal Etching System | 6300396 | ![]() |
| W-5910iB Quartz Crystal Etching System | 6300395 | ![]() |
| W-5920i Oscillator Inline Etching System | 6300381 | ![]() |
| W-5920 Oscillator Etching System | 6300355 | ![]() |
| W-280A/12SA Oscillator Plating System | 6300359 | ![]() |
| W-280A/6SA Oscillator Plating System Upgrade | 6300370 | ![]() |
MCF, SAW and FBAR Test and Production
Measurement Equipment
| Product | Part No. | Datasheet |
|---|---|---|
| 250B-1 Network Analyzer | 6300352 | ![]() |
| 250C 500MHz Network Analyzer | 6300343 | ![]() |
| 250D 800MHz Network Analyzer | 6300404 | ![]() |
Automatic Test Systems
| Product | Part No. | Datasheet |
|---|---|---|
| W-350D Quartz Crystal Test and Sort System | 6300345 | ![]() |
Temperature Test Systems
| Product | Part No. | Datasheet |
|---|---|---|
| W-2200B Temperature Test System | 6300231 | ![]() |
| T-714 Dual Row Crystal Test Wheel | 6300132 | ![]() |
| W-2200 SMD Disc Pallet Temperature Test System | 6300230 | ![]() |
Final Frequency Adjustment
| Product | Part No. | Datasheet |
|---|---|---|
| W-5920 Oscillator Etching System | 6300238 | ![]() |
| 5500B MCF Plating System | 6300108 | ![]() |
| 5500B MCF Three Pole Plating System | 6300146 | ![]() |
Discrete Component Test
Measurement Equipment
| Product | Part No. | Datasheet |
|---|---|---|
| 250B-1 220MHz Network Analyzer | 6300210 | ![]() |
| 250C 500MHz Network Analyzer | 6300343 | ![]() |
Temperature Test Systems
| Product | Part No. | Datasheet |
|---|---|---|
| W-2500 Capacitor Test System | 6300183 | ![]() |
| W-2500 Resistor Test System | 6300185 | ![]() |
| W-2500 Diode Test System | 6300184 | ![]() |
| W-2200 Ceramic Resonator Test System | 6300230 | ![]() |
Precision Temperature Test Chambers
Round Test Chambers
| Product | Part No. | Datasheet |
|---|---|---|
| 4220 Temperature Test Chamber | 6300095 | ![]() |
| 4220MR Temperature Test Chamber | 6300187 | ![]() |
Rectangular Test Chambers
| Product | Part No. | Datasheet |
|---|---|---|
| 4350MR Temperature Test Chamber | 6300408 | ![]() |
| 4350 Temperature Test Chamber | 6300104 | ![]() |
| 4365 Temperature Test Chamber | 6300233 | ![]() |
| 4366 Temperature Test Chamber | 6300111 | ![]() |
Thin Film Metal Deposition
| Product | Part No. | Datasheet |
|---|---|---|
| 5600 Deposition System | 6300186 | ![]() |
| Capacitively Coupled Plasma Upgrade | 6300342 | ![]() |


